Atomic force microscopes (AFMs) are instruments that allow three-dimensional imaging of surfaces with nanometer resolution and are important enabling tools for nanoscience and technology. The student who successfully completes this course will understand the functional principles of AFMs, be able to run one, and interpret the data that are collected. This course will be offered in 2021-22, and in alternating years thereafter. Some sections of this course may be offered as Writing Intensive (WI).